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Bibliographic Details
Main Authors: Schmidt, Daniel, Stetten, David. v., Agthe, Michael, Pearson, Arwen R., Beddard, Goddfrey . S., Yorke, Briony A., Tellkamp, Friedjof, Gaal, Peter
Format: Preprint
Published: 2025
Subjects:
Online Access:https://arxiv.org/abs/2505.08502
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author Schmidt, Daniel
Stetten, David. v.
Agthe, Michael
Pearson, Arwen R.
Beddard, Goddfrey . S.
Yorke, Briony A.
Tellkamp, Friedjof
Gaal, Peter
author_facet Schmidt, Daniel
Stetten, David. v.
Agthe, Michael
Pearson, Arwen R.
Beddard, Goddfrey . S.
Yorke, Briony A.
Tellkamp, Friedjof
Gaal, Peter
contents We present time-resolved X-ray diffraction measurements using advanced timing schemes that provide high temporal resolution while also maintaining a high flux in the X-ray probe beam. The method employs patterned probe pulse sequences that are generated with the WaveGate solid-state pulse picker. We demonstrate the feasibility of our method at two different beamlines on millisecond and microsecond timescales.
format Preprint
id arxiv_https___arxiv_org_abs_2505_08502
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Demonstration of Advanced Timing Schemes in Time-Resolved X-ray Diffraction Measurements
Schmidt, Daniel
Stetten, David. v.
Agthe, Michael
Pearson, Arwen R.
Beddard, Goddfrey . S.
Yorke, Briony A.
Tellkamp, Friedjof
Gaal, Peter
Materials Science
We present time-resolved X-ray diffraction measurements using advanced timing schemes that provide high temporal resolution while also maintaining a high flux in the X-ray probe beam. The method employs patterned probe pulse sequences that are generated with the WaveGate solid-state pulse picker. We demonstrate the feasibility of our method at two different beamlines on millisecond and microsecond timescales.
title Demonstration of Advanced Timing Schemes in Time-Resolved X-ray Diffraction Measurements
topic Materials Science
url https://arxiv.org/abs/2505.08502