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Main Authors: Campbell, Quinn T., Misra, Shashank, Ivie, Jeffrey A.
Format: Preprint
Published: 2025
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Online Access:https://arxiv.org/abs/2505.08684
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author Campbell, Quinn T.
Misra, Shashank
Ivie, Jeffrey A.
author_facet Campbell, Quinn T.
Misra, Shashank
Ivie, Jeffrey A.
contents One of the most promising acceptor precursors for atomic-precision $δ$-doping of silicon is BCl$_3$. The chemical pathway, and the resulting kinetics, through which BCl$_3$ adsorbs and dissociates on silicon, however, has only been partially explained. In this work, we use density functional theory to expand the dissociation reactions of BCl$_3$ to include reactions that take place across multiple silicon dimer rows, and reactions which end in a bare B atom either at the surface, substituted for a surface silicon, or in a subsurface position. We further simulate resulting scanning tunneling microscopy images for each of these BCl$_x$ dissociation fragments, demonstrating that they often display distinct features that may allow for relatively confident experimental identification. Finally, we input the full dissociation pathway for BCl$_3$ into a kinetic Monte Carlo model, which simulates realistic reaction pathways as a function of environmental conditions such as pressure and temperature of dosing. We find that BCl$_2$ is broadly dominant at low temperatures, while high temperatures and ample space on the silicon surface for dissociation encourage the formation of bridging BCl fragments and B substitutions on the surface. This work provides the chemical mechanisms for understanding atomic-precision doping of Si with B, enabling a number of relevant quantum applications such as bipolar nanoelectronics, acceptor-based qubits, and superconducting Si.
format Preprint
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institution arXiv
publishDate 2025
record_format arxiv
spellingShingle First-principles dissociation pathways of BCl$_3$ on the Si(100)-2$\times$1 surface
Campbell, Quinn T.
Misra, Shashank
Ivie, Jeffrey A.
Materials Science
One of the most promising acceptor precursors for atomic-precision $δ$-doping of silicon is BCl$_3$. The chemical pathway, and the resulting kinetics, through which BCl$_3$ adsorbs and dissociates on silicon, however, has only been partially explained. In this work, we use density functional theory to expand the dissociation reactions of BCl$_3$ to include reactions that take place across multiple silicon dimer rows, and reactions which end in a bare B atom either at the surface, substituted for a surface silicon, or in a subsurface position. We further simulate resulting scanning tunneling microscopy images for each of these BCl$_x$ dissociation fragments, demonstrating that they often display distinct features that may allow for relatively confident experimental identification. Finally, we input the full dissociation pathway for BCl$_3$ into a kinetic Monte Carlo model, which simulates realistic reaction pathways as a function of environmental conditions such as pressure and temperature of dosing. We find that BCl$_2$ is broadly dominant at low temperatures, while high temperatures and ample space on the silicon surface for dissociation encourage the formation of bridging BCl fragments and B substitutions on the surface. This work provides the chemical mechanisms for understanding atomic-precision doping of Si with B, enabling a number of relevant quantum applications such as bipolar nanoelectronics, acceptor-based qubits, and superconducting Si.
title First-principles dissociation pathways of BCl$_3$ on the Si(100)-2$\times$1 surface
topic Materials Science
url https://arxiv.org/abs/2505.08684