Assessing the Performance of Analog Training for Transfer Learning

Fuente: arXiv
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Autores principales: Fagbohungbe, Omobayode, Lammie, Corey, Rasch, Malte J., Ando, Takashi, Gokmen, Tayfun, Narayanan, Vijay
Formato: Preprint
Publicado: 2025
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author Fagbohungbe, Omobayode
Lammie, Corey
Rasch, Malte J.
Ando, Takashi
Gokmen, Tayfun
Narayanan, Vijay
author_facet Fagbohungbe, Omobayode
Lammie, Corey
Rasch, Malte J.
Ando, Takashi
Gokmen, Tayfun
Narayanan, Vijay
contents Analog in-memory computing is a next-generation computing paradigm that promises fast, parallel, and energy-efficient deep learning training and transfer learning (TL). However, achieving this promise has remained elusive due to a lack of suitable training algorithms. Analog memory devices exhibit asymmetric and non-linear switching behavior in addition to device-to-device variation, meaning that most, if not all, of the current off-the-shelf training algorithms cannot achieve good training outcomes. Also, recently introduced algorithms have enjoyed limited attention, as they require bi-directionally switching devices of unrealistically high symmetry and precision and are highly sensitive. A new algorithm chopped TTv2 (c-TTv2), has been introduced, which leverages the chopped technique to address many of the challenges mentioned above. In this paper, we assess the performance of the c-TTv2 algorithm for analog TL using a Swin-ViT model on a subset of the CIFAR100 dataset. We also investigate the robustness of our algorithm to changes in some device specifications, including weight transfer noise, symmetry point skew, and symmetry point variability
format Preprint
id arxiv_https___arxiv_org_abs_2505_11067
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Assessing the Performance of Analog Training for Transfer Learning
Fagbohungbe, Omobayode
Lammie, Corey
Rasch, Malte J.
Ando, Takashi
Gokmen, Tayfun
Narayanan, Vijay
Machine Learning
Artificial Intelligence
Hardware Architecture
Computer Vision and Pattern Recognition
Distributed, Parallel, and Cluster Computing
Neural and Evolutionary Computing
Analog in-memory computing is a next-generation computing paradigm that promises fast, parallel, and energy-efficient deep learning training and transfer learning (TL). However, achieving this promise has remained elusive due to a lack of suitable training algorithms. Analog memory devices exhibit asymmetric and non-linear switching behavior in addition to device-to-device variation, meaning that most, if not all, of the current off-the-shelf training algorithms cannot achieve good training outcomes. Also, recently introduced algorithms have enjoyed limited attention, as they require bi-directionally switching devices of unrealistically high symmetry and precision and are highly sensitive. A new algorithm chopped TTv2 (c-TTv2), has been introduced, which leverages the chopped technique to address many of the challenges mentioned above. In this paper, we assess the performance of the c-TTv2 algorithm for analog TL using a Swin-ViT model on a subset of the CIFAR100 dataset. We also investigate the robustness of our algorithm to changes in some device specifications, including weight transfer noise, symmetry point skew, and symmetry point variability
title Assessing the Performance of Analog Training for Transfer Learning
topic Machine Learning
Artificial Intelligence
Hardware Architecture
Computer Vision and Pattern Recognition
Distributed, Parallel, and Cluster Computing
Neural and Evolutionary Computing
url https://arxiv.org/abs/2505.11067