Siegl, M., Zanon, J., Sink, J., da Cruz, A. R., Hedgeland, H., Curson, N. J., . . . Schofield, S. R. (2025). Imaging the Acceptor Wave Function Anisotropy in Silicon.
Chicago Style (17th ed.) CitationSiegl, Manuel, Julian Zanon, Joseph Sink, Adonai Rodrigues da Cruz, Holly Hedgeland, Neil J. Curson, Michael E. Flatté, and Steven R. Schofield. Imaging the Acceptor Wave Function Anisotropy in Silicon. 2025.
MLA (9th ed.) CitationSiegl, Manuel, et al. Imaging the Acceptor Wave Function Anisotropy in Silicon. 2025.
Warning: These citations may not always be 100% accurate.