Truth or Twist? Optimal Model Selection for Reliable Label Flipping Evaluation in LLM-based Counterfactuals

Fuente: arXiv
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Bibliographic Details
Main Authors: Wang, Qianli, Nguyen, Van Bach, Feldhus, Nils, Villa-Arenas, Luis Felipe, Seifert, Christin, Möller, Sebastian, Schmitt, Vera
Format: Preprint
Published: 2025
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