Van der Waals devices for surface-sensitive experiments

Fuente: arXiv
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Autori principali: Taufertshöfer, Nicolai, Burri, Corinna, Venturini, Rok, Giannopoulos, Iason, Ekahana, Sandy Adhitia, Della Valle, Enrico, Mraz, Anže, Vaskivskyi, Yevhenii, Lipic, Jan, Barinov, Alexei, Kazazis, Dimitrios, Ekinci, Yasin, Mihailovic, Dragan, Gerber, Simon
Natura: Preprint
Pubblicazione: 2025
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author Taufertshöfer, Nicolai
Burri, Corinna
Venturini, Rok
Giannopoulos, Iason
Ekahana, Sandy Adhitia
Della Valle, Enrico
Mraz, Anže
Vaskivskyi, Yevhenii
Lipic, Jan
Barinov, Alexei
Kazazis, Dimitrios
Ekinci, Yasin
Mihailovic, Dragan
Gerber, Simon
author_facet Taufertshöfer, Nicolai
Burri, Corinna
Venturini, Rok
Giannopoulos, Iason
Ekahana, Sandy Adhitia
Della Valle, Enrico
Mraz, Anže
Vaskivskyi, Yevhenii
Lipic, Jan
Barinov, Alexei
Kazazis, Dimitrios
Ekinci, Yasin
Mihailovic, Dragan
Gerber, Simon
contents In-operando characterization of van der Waals (vdW) devices using surface-sensitive methods provides critical insights into phase transitions and correlated electronic states. Yet, integrating vdW materials in functional devices while maintaining pristine surfaces is a key challenge for combined transport and surface-sensitive experiments. Conventional lithographic techniques introduce surface contamination, limiting the applicability of state-of-the-art spectroscopic probes. We present a stencil lithography-based approach for fabricating vdW devices, producing micron-scale electrical contacts, and exfoliation in ultra-high vacuum. The resist-free patterning method utilizes a shadow mask to define electrical contacts and yields thin flakes down to the single-layer regime via gold-assisted exfoliation. As a demonstration, we fabricate devices from 1$T-$TaS$_2$ flakes, achieving reliable contacts for application of electrical pulses and resistance measurements, as well as clean surfaces allowing for angle-resolved photoemission spectroscopy. The approach provides a platform for studying the electronic properties of vdW systems with surface-sensitive probes in well-defined device geometries.
format Preprint
id arxiv_https___arxiv_org_abs_2505_14003
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Van der Waals devices for surface-sensitive experiments
Taufertshöfer, Nicolai
Burri, Corinna
Venturini, Rok
Giannopoulos, Iason
Ekahana, Sandy Adhitia
Della Valle, Enrico
Mraz, Anže
Vaskivskyi, Yevhenii
Lipic, Jan
Barinov, Alexei
Kazazis, Dimitrios
Ekinci, Yasin
Mihailovic, Dragan
Gerber, Simon
Mesoscale and Nanoscale Physics
Strongly Correlated Electrons
Applied Physics
In-operando characterization of van der Waals (vdW) devices using surface-sensitive methods provides critical insights into phase transitions and correlated electronic states. Yet, integrating vdW materials in functional devices while maintaining pristine surfaces is a key challenge for combined transport and surface-sensitive experiments. Conventional lithographic techniques introduce surface contamination, limiting the applicability of state-of-the-art spectroscopic probes. We present a stencil lithography-based approach for fabricating vdW devices, producing micron-scale electrical contacts, and exfoliation in ultra-high vacuum. The resist-free patterning method utilizes a shadow mask to define electrical contacts and yields thin flakes down to the single-layer regime via gold-assisted exfoliation. As a demonstration, we fabricate devices from 1$T-$TaS$_2$ flakes, achieving reliable contacts for application of electrical pulses and resistance measurements, as well as clean surfaces allowing for angle-resolved photoemission spectroscopy. The approach provides a platform for studying the electronic properties of vdW systems with surface-sensitive probes in well-defined device geometries.
title Van der Waals devices for surface-sensitive experiments
topic Mesoscale and Nanoscale Physics
Strongly Correlated Electrons
Applied Physics
url https://arxiv.org/abs/2505.14003