Few-Shot Test-Time Optimization Without Retraining for Semiconductor Recipe Generation and Beyond

Fuente: arXiv

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Bibliographic Details
Main Authors:	Gu, Shangding, Ying, Donghao, Jin, Ming, Lu, Yu Joe, Wang, Jun, Lavaei, Javad, Spanos, Costas
Format:	Preprint
Published:	2025
Subjects:	Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2505.16060