SemSegBench & DetecBench: Benchmarking Reliability and Generalization Beyond Classification

Fuente: arXiv

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Bibliographic Details
Main Authors:	Agnihotri, Shashank, Schader, David, Jakubassa, Jonas, Sharei, Nico, Kral, Simon, Kaçar, Mehmet Ege, Weber, Ruben, Keuper, Margret
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2505.18015