Test-Time Adaptation with Binary Feedback

Fuente: arXiv

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Bibliographic Details
Main Authors:	Lee, Taeckyung, Chottananurak, Sorn, Kim, Junsu, Shin, Jinwoo, Gong, Taesik, Lee, Sung-Ju
Format:	Preprint
Published:	2025
Subjects:	Machine Learning Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2505.18514