APA (7th ed.) Citation

Pshyk, O. V., Patidar, J., Cancellieri, C., & Siol, S. (2025). Auger parameter analysis for TiN and AlN thin films via combined in-situ XPS and HAXPES.

Chicago Style (17th ed.) Citation

Pshyk, O. V., J. Patidar, C. Cancellieri, and S. Siol. Auger Parameter Analysis for TiN and AlN Thin Films via Combined In-situ XPS and HAXPES. 2025.

MLA (9th ed.) Citation

Pshyk, O. V., et al. Auger Parameter Analysis for TiN and AlN Thin Films via Combined In-situ XPS and HAXPES. 2025.