Optically detected magnetic resonance of wafer-scale hexagonal boron nitride thin films

Fuente: arXiv

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Bibliographic Details
Main Authors:	Scholten, Sam C., Iwański, Jakub, Xing, Kaijian, Binder, Johannes, Dąbrowska, Aleksandra K., Tan, Hark H., Cheng, Tin S., Bradford, Jonathan, Mellor, Christopher J., Beton, Peter H., Novikov, Sergei V., Mischke, Jan, Pasko, Sergej, Yengel, Emre, Henning, Alexander, Krotkus, Simonas, Wysmołek, Andrzej, Tetienne, Jean-Philippe
Format:	Preprint
Published:	2025
Subjects:	Materials Science Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2505.21143