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Optically detected magnetic resonance of wafer-scale hexagonal boron nitride thin films

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Scholten, Sam C., Iwański, Jakub, Xing, Kaijian, Binder, Johannes, Dąbrowska, Aleksandra K., Tan, Hark H., Cheng, Tin S., Bradford, Jonathan, Mellor, Christopher J., Beton, Peter H., Novikov, Sergei V., Mischke, Jan, Pasko, Sergej, Yengel, Emre, Henning, Alexander, Krotkus, Simonas, Wysmołek, Andrzej, Tetienne, Jean-Philippe
Natura:	Preprint
Pubblicazione:	2025
Soggetti:	Materials Science Mesoscale and Nanoscale Physics
Accesso online:	Acceder al recurso
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