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OmniAD: Detect and Understand Industrial Anomaly via Multimodal Reasoning

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhao, Shifang, Lin, Yiheng, Han, Lu, Zhao, Yao, Wei, Yunchao
Format:	Preprint
Published:	2025
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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