Keith, M. J., Spiewak, R., Lyne, A. G., Weltevrede, P., Antonopoulou, D., & Stappers, B. (2025). Measuring pulsar profile variations with 2-D Gaussian process regression.
Cita Chicago Style (17a ed.)Keith, Michael J., Renée Spiewak, Andrew G. Lyne, Patrick Weltevrede, Danai Antonopoulou, y Ben Stappers. Measuring Pulsar Profile Variations with 2-D Gaussian Process Regression. 2025.
Cita MLA (9a ed.)Keith, Michael J., et al. Measuring Pulsar Profile Variations with 2-D Gaussian Process Regression. 2025.
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