Czarnecki, A. J., Kolev, N. L., See, P., Sullivan, N., Behn, W. A., Curson, N. J., . . . Grütter, P. (2025). Hydrogen Passivation Effects on Spatially Resolved Charge Trap Densities in Si(100)-SiO$_2$.
Style de citation Chicago (17e éd.)Czarnecki, Adam J., Nikola L. Kolev, Patrick See, Nick Sullivan, Wyatt A. Behn, Neil J. Curson, Taylor J. Z. Stock, et Peter Grütter. Hydrogen Passivation Effects on Spatially Resolved Charge Trap Densities in Si(100)-SiO$_2$. 2025.
Style de citation MLA (9e éd.)Czarnecki, Adam J., et al. Hydrogen Passivation Effects on Spatially Resolved Charge Trap Densities in Si(100)-SiO$_2$. 2025.
Attention : ces citations peuvent ne pas être correctes à 100%.