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Hydrogen Passivation Effects on Spatially Resolved Charge Trap Densities in Si(100)-SiO$_2$

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Czarnecki, Adam J., Kolev, Nikola L., See, Patrick, Sullivan, Nick, Behn, Wyatt A., Curson, Neil J., Stock, Taylor J. Z., Grütter, Peter
Format:	Preprint
Publié:	2025
Sujets:	Materials Science
Accès en ligne:	Acceder al recurso
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