Critical Batch Size Revisited: A Simple Empirical Approach to Large-Batch Language Model Training

Fuente: arXiv

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Bibliographic Details
Main Authors:	Merrill, William, Arora, Shane, Groeneveld, Dirk, Hajishirzi, Hannaneh
Format:	Preprint
Published:	2025
Subjects:	Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2505.23971