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Decoupling Electric Field and Temperature-Driven Atomistic Forming Mechanisms in TaOx/HfO2-Based ReRAMs using Reactive Molecular Dynamics Simulations

Fuente: arXiv

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Bibliographic Details
Main Authors:	Lahkar, Simanta, Bragaglia, Valeria, Bagheri, Behnaz, Falcone, Donato Francesco, Galetta, Matteo, Sousa, Marilyne, Todri-Sanial, Aida
Format:	Preprint
Published:	2025
Subjects:	Materials Science Applied Physics Computational Physics
Online Access:	Acceder al recurso
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