Automatic detection and characterization of random telegraph noise in sCMOS sensors
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arXiv
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| Main Authors: | , , , |
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| Format: | Preprint |
| Published: |
2025
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| _version_ | 1866917062099599360 |
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| author | Özdoğru, Arda Karpov, Sergey Christov, Asen Vítek, Stanislav |
| author_facet | Özdoğru, Arda Karpov, Sergey Christov, Asen Vítek, Stanislav |
| contents | Scientific CMOS (sCMOS) image sensors are a modern alternative to typical CCD detectors and are rapidly gaining popularity in observational astronomy due to their large sizes, low read-out noise, high frame rates, and cheap manufacturing. However, numerous challenges remain in using them due to fundamental differences between CCD and CMOS architectures, especially concerning the pixel-dependent and non-Gaussian nature of their read-out noise. One of the main components of the latter is the random telegraph noise (RTN) caused by the charge traps introduced by the defects close to the oxide-silicon interface in sCMOS image sensors, which manifests itself as discrete jumps in a pixel's output signal, degrading the overall image fidelity. In this work, we present a statistical method to detect and characterize RTN-affected pixels using a series of dark frames. Identifying RTN contaminated pixels enables post-processing strategies that mitigate their impact and the development of manufacturing quality metrics. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2505_24540 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Automatic detection and characterization of random telegraph noise in sCMOS sensors Özdoğru, Arda Karpov, Sergey Christov, Asen Vítek, Stanislav Instrumentation and Methods for Astrophysics Scientific CMOS (sCMOS) image sensors are a modern alternative to typical CCD detectors and are rapidly gaining popularity in observational astronomy due to their large sizes, low read-out noise, high frame rates, and cheap manufacturing. However, numerous challenges remain in using them due to fundamental differences between CCD and CMOS architectures, especially concerning the pixel-dependent and non-Gaussian nature of their read-out noise. One of the main components of the latter is the random telegraph noise (RTN) caused by the charge traps introduced by the defects close to the oxide-silicon interface in sCMOS image sensors, which manifests itself as discrete jumps in a pixel's output signal, degrading the overall image fidelity. In this work, we present a statistical method to detect and characterize RTN-affected pixels using a series of dark frames. Identifying RTN contaminated pixels enables post-processing strategies that mitigate their impact and the development of manufacturing quality metrics. |
| title | Automatic detection and characterization of random telegraph noise in sCMOS sensors |
| topic | Instrumentation and Methods for Astrophysics |
| url | https://arxiv.org/abs/2505.24540 |