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Accurate grain boundary plane distributions for textured microstructures from stereological analysis of orthogonal two-dimensional electron backscatter diffraction orientation maps

Fuente: arXiv

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Bibliographic Details
Main Authors:	Folwarczny, Martin, Li, Ao, Shah, Rushvi, Chote, Aaron, Austin, Alexandra C., Zhu, Yimin, Rohrer, Gregory S., Jackson, Michael A., Kotakadi, Souhardh, Marquardt, Katharina
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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