Flux-trapping characterization for superconducting electronics using a cryogenic widefield N-$V$ diamond microscope

Fuente: arXiv

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Bibliographic Details
Main Authors:	Kapur, Rohan T., Kehayias, Pauli, Tolpygo, Sergey K., Libson, Adam A., Haldeman, George, Muniz, Collin N., Wynn, Alex, O'Connor, Nathaniel J., Parmar, Neel A., Johnson, Ryan, Maccabe, Andrew C., Cummings, John, Mallek, Justin L., Braje, Danielle A., Schloss, Jennifer M.
Format:	Preprint
Published:	2025
Subjects:	Superconductivity Applied Physics Instrumentation and Detectors Quantum Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2506.01906