Flux-trapping characterization for superconducting electronics using a cryogenic widefield N-$V$ diamond microscope
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arXiv
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| Format: | Preprint |
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2025
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| author | Kapur, Rohan T. Kehayias, Pauli Tolpygo, Sergey K. Libson, Adam A. Haldeman, George Muniz, Collin N. Wynn, Alex O'Connor, Nathaniel J. Parmar, Neel A. Johnson, Ryan Maccabe, Andrew C. Cummings, John Mallek, Justin L. Braje, Danielle A. Schloss, Jennifer M. |
| author_facet | Kapur, Rohan T. Kehayias, Pauli Tolpygo, Sergey K. Libson, Adam A. Haldeman, George Muniz, Collin N. Wynn, Alex O'Connor, Nathaniel J. Parmar, Neel A. Johnson, Ryan Maccabe, Andrew C. Cummings, John Mallek, Justin L. Braje, Danielle A. Schloss, Jennifer M. |
| contents | Magnetic flux trapping is a significant hurdle limiting the reliability and scalability of superconducting electronics, yet tools for imaging flux vortices remain slow or insensitive. We present a cryogenic widefield NV-diamond magnetic microscope capable of rapid, micrometer-scale imaging of flux trapping in superconducting devices. Using this technique, we measure vortex expulsion fields in Nb thin films and patterned strips, revealing a crossover in expulsion behavior between $10$ and $20~μ$m strip widths. The observed scaling agrees with theoretical models and suggests the influence of film defects on vortex expulsion dynamics. This instrument enables high-throughput magnetic characterization of superconducting materials and circuits, providing new insight for flux mitigation strategies in scalable superconducting electronics. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2506_01906 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Flux-trapping characterization for superconducting electronics using a cryogenic widefield N-$V$ diamond microscope Kapur, Rohan T. Kehayias, Pauli Tolpygo, Sergey K. Libson, Adam A. Haldeman, George Muniz, Collin N. Wynn, Alex O'Connor, Nathaniel J. Parmar, Neel A. Johnson, Ryan Maccabe, Andrew C. Cummings, John Mallek, Justin L. Braje, Danielle A. Schloss, Jennifer M. Superconductivity Applied Physics Instrumentation and Detectors Quantum Physics Magnetic flux trapping is a significant hurdle limiting the reliability and scalability of superconducting electronics, yet tools for imaging flux vortices remain slow or insensitive. We present a cryogenic widefield NV-diamond magnetic microscope capable of rapid, micrometer-scale imaging of flux trapping in superconducting devices. Using this technique, we measure vortex expulsion fields in Nb thin films and patterned strips, revealing a crossover in expulsion behavior between $10$ and $20~μ$m strip widths. The observed scaling agrees with theoretical models and suggests the influence of film defects on vortex expulsion dynamics. This instrument enables high-throughput magnetic characterization of superconducting materials and circuits, providing new insight for flux mitigation strategies in scalable superconducting electronics. |
| title | Flux-trapping characterization for superconducting electronics using a cryogenic widefield N-$V$ diamond microscope |
| topic | Superconductivity Applied Physics Instrumentation and Detectors Quantum Physics |
| url | https://arxiv.org/abs/2506.01906 |