Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning

Fuente: arXiv

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Bibliographic Details
Main Authors:	WeiQuan, Wang, Mian, Riaz-ul-Haque
Format:	Preprint
Published:	2025
Subjects:	Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2506.03556