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Neural Object Detection for 4D STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Genc, Arda, Silverstein, Ravit
Formato:	Preprint
Publicado:	2025
Materias:	Materials Science
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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