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| Main Authors: | , , |
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| Format: | Preprint |
| Published: |
2025
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2506.07139 |
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| _version_ | 1866912418936913920 |
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| author | Hambardzumyan, Arev Ghasabyan, Rafayel Tamazyan, Vahagn |
| author_facet | Hambardzumyan, Arev Ghasabyan, Rafayel Tamazyan, Vahagn |
| contents | In the realm of contemporary materials testing, the demand for scalability, adaptability, parallelism, and speed has surged due to the proliferation of diverse materials and testing standards. Traditional controller-based systems often fall short in meeting these requirements, resulting in adaptability and processing speed limitations. Conversely, FPGA-based controllers present a multifaceted, high-performance solution. Key advantages of FPGA-based controllers in materials testing encompass reconfiguration capabilities for cost-effective adaptation to evolving materials and standards. FPGAs also enable the integration of parallel control and data acquisition circuits, vital for multichannel test equipment demanding simultaneous, independent operation of multiple control channels. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2506_07139 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | FPGA-Based Material Testing Machine Controller Hambardzumyan, Arev Ghasabyan, Rafayel Tamazyan, Vahagn Systems and Control Materials Science Hardware Architecture In the realm of contemporary materials testing, the demand for scalability, adaptability, parallelism, and speed has surged due to the proliferation of diverse materials and testing standards. Traditional controller-based systems often fall short in meeting these requirements, resulting in adaptability and processing speed limitations. Conversely, FPGA-based controllers present a multifaceted, high-performance solution. Key advantages of FPGA-based controllers in materials testing encompass reconfiguration capabilities for cost-effective adaptation to evolving materials and standards. FPGAs also enable the integration of parallel control and data acquisition circuits, vital for multichannel test equipment demanding simultaneous, independent operation of multiple control channels. |
| title | FPGA-Based Material Testing Machine Controller |
| topic | Systems and Control Materials Science Hardware Architecture |
| url | https://arxiv.org/abs/2506.07139 |