APA (7th ed.) Citation

Lenton, I. C. D., Pertl, F., Shafeek, L., & Waitukaitis, S. R. (2025). A duality between surface charge and work function in scanning Kelvin probe microscopy.

Chicago Style (17th ed.) Citation

Lenton, Isaac C. D., Felix Pertl, Lubuna Shafeek, and Scott R. Waitukaitis. A Duality Between Surface Charge and Work Function in Scanning Kelvin Probe Microscopy. 2025.

MLA (9th ed.) Citation

Lenton, Isaac C. D., et al. A Duality Between Surface Charge and Work Function in Scanning Kelvin Probe Microscopy. 2025.