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A duality between surface charge and work function in scanning Kelvin probe microscopy

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Lenton, Isaac C. D., Pertl, Felix, Shafeek, Lubuna, Waitukaitis, Scott R.
Format:	Preprint
Publié:	2025
Sujets:	Applied Physics
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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