Copertina

Engineering Cryogenic FETs: Addressing SCEs and Impact of Interface Traps Down to 2 K Temperature

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Pandey, Nilesh, Basu, Dipanjan, Banerjee, Sanjay K.
Natura:	Preprint
Pubblicazione:	2025
Soggetti:	Applied Physics
Accesso online:	Acceder al recurso
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