Anisotropic In-plane Thermal Conductivity of Freestanding Few-layer ReS2

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Singh, Manavendra Pratap, Naik, Akshay
Format: Preprint
Published: 2025
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866918054893453312
author Singh, Manavendra Pratap
Naik, Akshay
author_facet Singh, Manavendra Pratap
Naik, Akshay
contents Rhenium disulfide (ReS2) is a unique TMDC with a strong in-plane anisotropy and weak interlayer coupling. The pronounced anisotropy in the thermal conductivity observed in bulk ReS2 flakes (exceeding 60 nm) makes them valuable for applications that require directional heat management or isolation. Whether this anisotropy is maintained below 10 nm has not yet been studied. Here, we measured the thermal conductivity of freestanding, exfoliated, few-layer ReS2 samples (thickness < 10 nm) on SiO2/Si holey substrates using the optothermal Raman technique. Polarization-dependent Raman measurements revealed variation in thermal conductivity along the high symmetry axes. The total in-plane thermal conductivities show a nonmonotonic trend with ReS2 thickness ranging from 2.5 to 8 nm. The in-plane thermal conductivity of few-layer ReS2 devices, which varies with thickness, holds significant potential for applications in nanoscale thermoelectric devices.
format Preprint
id arxiv_https___arxiv_org_abs_2506_09500
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Anisotropic In-plane Thermal Conductivity of Freestanding Few-layer ReS2
Singh, Manavendra Pratap
Naik, Akshay
Mesoscale and Nanoscale Physics
Rhenium disulfide (ReS2) is a unique TMDC with a strong in-plane anisotropy and weak interlayer coupling. The pronounced anisotropy in the thermal conductivity observed in bulk ReS2 flakes (exceeding 60 nm) makes them valuable for applications that require directional heat management or isolation. Whether this anisotropy is maintained below 10 nm has not yet been studied. Here, we measured the thermal conductivity of freestanding, exfoliated, few-layer ReS2 samples (thickness < 10 nm) on SiO2/Si holey substrates using the optothermal Raman technique. Polarization-dependent Raman measurements revealed variation in thermal conductivity along the high symmetry axes. The total in-plane thermal conductivities show a nonmonotonic trend with ReS2 thickness ranging from 2.5 to 8 nm. The in-plane thermal conductivity of few-layer ReS2 devices, which varies with thickness, holds significant potential for applications in nanoscale thermoelectric devices.
title Anisotropic In-plane Thermal Conductivity of Freestanding Few-layer ReS2
topic Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2506.09500