Coercive Field Reduction in Ultra-thin Al1-XScXN via Interfacial Engineering with a Scandium Electrode

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zhang, Yinuo, Rai, Rajeev Kumar, Esteves, Giovanni, Wang, Yubo, Jariwala, Deep M., Stach, Eric A., Olsson III, Roy H.
Format:	Preprint
Published:	2025
Subjects:	Materials Science Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2506.10169