Technical Report with Proofs for A Full Picture in Conformance Checking: Efficiently Summarizing All Optimal Alignments

Fuente: arXiv

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Bibliographic Details
Main Authors:	Bär, Philipp, Wynn, Moe T., Leemans, Sander J. J.
Format:	Preprint
Published:	2025
Subjects:	Information Theory Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2506.10345