Alternating steepest descent methods for tensor completion with applications to spectromicroscopy
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arXiv
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| Autores principales: | , , , |
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| Formato: | Preprint |
| Publicado: |
2025
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| _version_ | 1866909647000043520 |
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| author | Townsend, Oliver Dolgov, Sergey Gazzola, Silvia Kilmer, Misha |
| author_facet | Townsend, Oliver Dolgov, Sergey Gazzola, Silvia Kilmer, Misha |
| contents | In this paper we develop two new Tensor Alternating Steepest Descent algorithms for tensor completion in the low-rank $\star_{M}$-product format, whereby we aim to reconstruct an entire low-rank tensor from a small number of measurements thereof. Both algorithms are rooted in the Alternating Steepest Descent (ASD) method for matrix completion, first proposed in [J. Tanner and K. Wei, Appl. Comput. Harmon. Anal., 40 (2016), pp. 417-429]. In deriving the new methods we target the X-ray spectromicroscopy undersampling problem, whereby data are collected by scanning a specimen on a rectangular viewpoint with X-ray beams of different energies. The recorded absorptions coefficients of the mixed specimen materials are naturally stored in a third-order tensor, with spatial horizontal and vertical axes, and an energy axis. To speed the X-ray spectromicroscopy measurement process up, only a fraction of tubes from (a reshaped version of) this tensor are fully scanned, leading to a tensor completion problem. In this framework we can apply any transform (such as the Fourier transform) to the tensor tube by tube, providing a natural way to work with the $\star_{M}$-tensor algebra, and propose: (1) a tensor completion algorithm that is essentially ASD reformulated in the $\star_{M}$-induced metric space and (2) a tensor completion algorithm that solves a set of (readily parallelizable) independent matrix completion problems for the frontal slices of the transformed tensor. The two new methods are tested on real X-ray spectromicroscopy data, demonstrating that they achieve the same reconstruction error with fewer samples from the tensor compared to the matrix completion algorithms applied to a flattened tensor. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2506_10661 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Alternating steepest descent methods for tensor completion with applications to spectromicroscopy Townsend, Oliver Dolgov, Sergey Gazzola, Silvia Kilmer, Misha Numerical Analysis In this paper we develop two new Tensor Alternating Steepest Descent algorithms for tensor completion in the low-rank $\star_{M}$-product format, whereby we aim to reconstruct an entire low-rank tensor from a small number of measurements thereof. Both algorithms are rooted in the Alternating Steepest Descent (ASD) method for matrix completion, first proposed in [J. Tanner and K. Wei, Appl. Comput. Harmon. Anal., 40 (2016), pp. 417-429]. In deriving the new methods we target the X-ray spectromicroscopy undersampling problem, whereby data are collected by scanning a specimen on a rectangular viewpoint with X-ray beams of different energies. The recorded absorptions coefficients of the mixed specimen materials are naturally stored in a third-order tensor, with spatial horizontal and vertical axes, and an energy axis. To speed the X-ray spectromicroscopy measurement process up, only a fraction of tubes from (a reshaped version of) this tensor are fully scanned, leading to a tensor completion problem. In this framework we can apply any transform (such as the Fourier transform) to the tensor tube by tube, providing a natural way to work with the $\star_{M}$-tensor algebra, and propose: (1) a tensor completion algorithm that is essentially ASD reformulated in the $\star_{M}$-induced metric space and (2) a tensor completion algorithm that solves a set of (readily parallelizable) independent matrix completion problems for the frontal slices of the transformed tensor. The two new methods are tested on real X-ray spectromicroscopy data, demonstrating that they achieve the same reconstruction error with fewer samples from the tensor compared to the matrix completion algorithms applied to a flattened tensor. |
| title | Alternating steepest descent methods for tensor completion with applications to spectromicroscopy |
| topic | Numerical Analysis |
| url | https://arxiv.org/abs/2506.10661 |