Cita APA (7a ed.)

Krishna, S., Singh, B., Roychowdhury, S., Sridhara, G., Mazumdar, S., Sandelin, M., . . . Gajda, J. (2025). Test code generation at Ericsson using Program Analysis Augmented Fine Tuned LLMs.

Cita Chicago Style (17a ed.)

Krishna, Sai, et al. Test Code Generation at Ericsson Using Program Analysis Augmented Fine Tuned LLMs. 2025.

Cita MLA (9a ed.)

Krishna, Sai, et al. Test Code Generation at Ericsson Using Program Analysis Augmented Fine Tuned LLMs. 2025.