Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments
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arXiv
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| Autori principali: | , , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2025
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| _version_ | 1866911006445273088 |
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| author | Carpenter, Riley J. Anczarski, Jadyn Rydstrom, Ivar Simchony, Aviv Smith, Zoe J. Kurinsky, Noah A. Young, Betty A. |
| author_facet | Carpenter, Riley J. Anczarski, Jadyn Rydstrom, Ivar Simchony, Aviv Smith, Zoe J. Kurinsky, Noah A. Young, Betty A. |
| contents | Predictable circuit response is a critical prerequisite for accurate electronic measurements. We describe a powerful, yet straightforward, experimental method and analysis model that utilizes an affordable LCR meter in conjunction with an in situ parasitic impedance background correction procedure to measure the temperature-dependent impedance (magnitude and phase) of individual passive circuit elements mounted in a cryostat. We show how the model unambiguously identified a 20x drop in capacitance for 22 microF 5XR multilayer ceramic capacitors cooled from 300 K to 360 mK in an environment with parasitic capacitance of order 300 pF. The same experimental procedure, based on a simple two-wire measurement, was also used to successfully measure 10 pF and 22 pF thin-film capacitors and 100 MOhm thick-film resistors. The results showed that the resistor values increased by up to an order of magnitude when the devices were cooled from 300 K to 360 mK. Most importantly, the simple data acquisition method and robust analysis model were shown to effectively extend the accuracy of a simple benchtop LCR meter beyond its manufacturer-guaranteed values for a wide range of measurement frequencies. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2506_12268 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments Carpenter, Riley J. Anczarski, Jadyn Rydstrom, Ivar Simchony, Aviv Smith, Zoe J. Kurinsky, Noah A. Young, Betty A. Instrumentation and Detectors Predictable circuit response is a critical prerequisite for accurate electronic measurements. We describe a powerful, yet straightforward, experimental method and analysis model that utilizes an affordable LCR meter in conjunction with an in situ parasitic impedance background correction procedure to measure the temperature-dependent impedance (magnitude and phase) of individual passive circuit elements mounted in a cryostat. We show how the model unambiguously identified a 20x drop in capacitance for 22 microF 5XR multilayer ceramic capacitors cooled from 300 K to 360 mK in an environment with parasitic capacitance of order 300 pF. The same experimental procedure, based on a simple two-wire measurement, was also used to successfully measure 10 pF and 22 pF thin-film capacitors and 100 MOhm thick-film resistors. The results showed that the resistor values increased by up to an order of magnitude when the devices were cooled from 300 K to 360 mK. Most importantly, the simple data acquisition method and robust analysis model were shown to effectively extend the accuracy of a simple benchtop LCR meter beyond its manufacturer-guaranteed values for a wide range of measurement frequencies. |
| title | Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments |
| topic | Instrumentation and Detectors |
| url | https://arxiv.org/abs/2506.12268 |