Correcting impedance measurements for background parasitics to characterize circuit components in cryogenic environments

Fuente: arXiv
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Bibliographic Details
Main Authors: Carpenter, Riley J., Anczarski, Jadyn, Rydstrom, Ivar, Simchony, Aviv, Smith, Zoe J., Kurinsky, Noah A., Young, Betty A.
Format: Preprint
Published: 2025
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