TR2M: Transferring Monocular Relative Depth to Metric Depth with Language Descriptions and Dual-Level Scale-Oriented Contrast

Fuente: arXiv
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Autores principales: Cui, Beilei, Huang, Yiming, Bai, Long, Ren, Hongliang
Formato: Preprint
Publicado: 2025
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author Cui, Beilei
Huang, Yiming
Bai, Long
Ren, Hongliang
author_facet Cui, Beilei
Huang, Yiming
Bai, Long
Ren, Hongliang
contents This work presents a generalizable framework to transfer relative depth to metric depth. Current monocular depth estimation methods are mainly divided into metric depth estimation (MMDE) and relative depth estimation (MRDE). MMDEs estimate depth in metric scale but are often limited to a specific domain. MRDEs generalize well across different domains, but with uncertain scales which hinders downstream applications. To this end, we aim to build up a framework to solve scale uncertainty and transfer relative depth to metric depth. Previous methods used language as input and estimated two factors for conducting rescaling. Our approach, TR2M, utilizes both text description and image as inputs and estimates two rescale maps to transfer relative depth to metric depth at pixel level. Features from two modalities are fused with a cross-modality attention module to better capture scale information. A strategy is designed to construct and filter confident pseudo metric depth for more comprehensive supervision. We also develop scale-oriented contrastive learning to utilize depth distribution as guidance to enforce the model learning about intrinsic knowledge aligning with the scale distribution. TR2M only exploits a small number of trainable parameters to train on datasets in various domains and experiments not only demonstrate TR2M's great performance in seen datasets but also reveal superior zero-shot capabilities on five unseen datasets. We show the huge potential in pixel-wise transferring relative depth to metric depth with language assistance. (Code is available at: https://github.com/BeileiCui/TR2M)
format Preprint
id arxiv_https___arxiv_org_abs_2506_13387
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle TR2M: Transferring Monocular Relative Depth to Metric Depth with Language Descriptions and Dual-Level Scale-Oriented Contrast
Cui, Beilei
Huang, Yiming
Bai, Long
Ren, Hongliang
Computer Vision and Pattern Recognition
This work presents a generalizable framework to transfer relative depth to metric depth. Current monocular depth estimation methods are mainly divided into metric depth estimation (MMDE) and relative depth estimation (MRDE). MMDEs estimate depth in metric scale but are often limited to a specific domain. MRDEs generalize well across different domains, but with uncertain scales which hinders downstream applications. To this end, we aim to build up a framework to solve scale uncertainty and transfer relative depth to metric depth. Previous methods used language as input and estimated two factors for conducting rescaling. Our approach, TR2M, utilizes both text description and image as inputs and estimates two rescale maps to transfer relative depth to metric depth at pixel level. Features from two modalities are fused with a cross-modality attention module to better capture scale information. A strategy is designed to construct and filter confident pseudo metric depth for more comprehensive supervision. We also develop scale-oriented contrastive learning to utilize depth distribution as guidance to enforce the model learning about intrinsic knowledge aligning with the scale distribution. TR2M only exploits a small number of trainable parameters to train on datasets in various domains and experiments not only demonstrate TR2M's great performance in seen datasets but also reveal superior zero-shot capabilities on five unseen datasets. We show the huge potential in pixel-wise transferring relative depth to metric depth with language assistance. (Code is available at: https://github.com/BeileiCui/TR2M)
title TR2M: Transferring Monocular Relative Depth to Metric Depth with Language Descriptions and Dual-Level Scale-Oriented Contrast
topic Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2506.13387