HoangVan, X., Dinh, D. B., Canh, T. N., & Nguyen, V. (2025). ESRPCB: An Edge guided Super-Resolution model and Ensemble learning for tiny Printed Circuit Board Defect detection.
Style de citation Chicago (17e éd.)HoangVan, Xiem, Dang Bui Dinh, Thanh Nguyen Canh, et Van-Truong Nguyen. ESRPCB: An Edge Guided Super-Resolution Model and Ensemble Learning for Tiny Printed Circuit Board Defect Detection. 2025.
Style de citation MLA (9e éd.)HoangVan, Xiem, et al. ESRPCB: An Edge Guided Super-Resolution Model and Ensemble Learning for Tiny Printed Circuit Board Defect Detection. 2025.
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