Cita APA (7a ed.)

HoangVan, X., Dinh, D. B., Canh, T. N., & Nguyen, V. (2025). ESRPCB: An Edge guided Super-Resolution model and Ensemble learning for tiny Printed Circuit Board Defect detection.

Cita Chicago Style (17a ed.)

HoangVan, Xiem, Dang Bui Dinh, Thanh Nguyen Canh, y Van-Truong Nguyen. ESRPCB: An Edge Guided Super-Resolution Model and Ensemble Learning for Tiny Printed Circuit Board Defect Detection. 2025.

Cita MLA (9a ed.)

HoangVan, Xiem, et al. ESRPCB: An Edge Guided Super-Resolution Model and Ensemble Learning for Tiny Printed Circuit Board Defect Detection. 2025.