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| Autori principali: | , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2025
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| Soggetti: | |
| Accesso online: | https://arxiv.org/abs/2506.13476 |
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| _version_ | 1866916795969961984 |
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| author | HoangVan, Xiem Dinh, Dang Bui Canh, Thanh Nguyen Nguyen, Van-Truong |
| author_facet | HoangVan, Xiem Dinh, Dang Bui Canh, Thanh Nguyen Nguyen, Van-Truong |
| contents | Printed Circuit Boards (PCBs) are critical components in modern electronics, which require stringent quality control to ensure proper functionality. However, the detection of defects in small-scale PCBs images poses significant challenges as a result of the low resolution of the captured images, leading to potential confusion between defects and noise. To overcome these challenges, this paper proposes a novel framework, named ESRPCB (edgeguided super-resolution for PCBs defect detection), which combines edgeguided super-resolution with ensemble learning to enhance PCBs defect detection. The framework leverages the edge information to guide the EDSR (Enhanced Deep Super-Resolution) model with a novel ResCat (Residual Concatenation) structure, enabling it to reconstruct high-resolution images from small PCBs inputs. By incorporating edge features, the super-resolution process preserves critical structural details, ensuring that tiny defects remain distinguishable in the enhanced image. Following this, a multi-modal defect detection model employs ensemble learning to analyze the super-resolved |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2506_13476 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | ESRPCB: an Edge guided Super-Resolution model and Ensemble learning for tiny Printed Circuit Board Defect detection HoangVan, Xiem Dinh, Dang Bui Canh, Thanh Nguyen Nguyen, Van-Truong Computer Vision and Pattern Recognition Artificial Intelligence Image and Video Processing Printed Circuit Boards (PCBs) are critical components in modern electronics, which require stringent quality control to ensure proper functionality. However, the detection of defects in small-scale PCBs images poses significant challenges as a result of the low resolution of the captured images, leading to potential confusion between defects and noise. To overcome these challenges, this paper proposes a novel framework, named ESRPCB (edgeguided super-resolution for PCBs defect detection), which combines edgeguided super-resolution with ensemble learning to enhance PCBs defect detection. The framework leverages the edge information to guide the EDSR (Enhanced Deep Super-Resolution) model with a novel ResCat (Residual Concatenation) structure, enabling it to reconstruct high-resolution images from small PCBs inputs. By incorporating edge features, the super-resolution process preserves critical structural details, ensuring that tiny defects remain distinguishable in the enhanced image. Following this, a multi-modal defect detection model employs ensemble learning to analyze the super-resolved |
| title | ESRPCB: an Edge guided Super-Resolution model and Ensemble learning for tiny Printed Circuit Board Defect detection |
| topic | Computer Vision and Pattern Recognition Artificial Intelligence Image and Video Processing |
| url | https://arxiv.org/abs/2506.13476 |