Enhancing Gate Control and Mitigating Short Channel Effects in 20-50 nm Channel Length Amorphous Oxide Thin Film Transistors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Yoon, Chankeun, Ahn, Juhan, Zhou, Yuchen, Kulkarni, Jaydeep P., Dodabalapur, Ananth
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2506.14156