Simultaneous Charge Carrier Density Mapping of SiC Epilayers and Substrates with Terahertz Time-Domain Spectroscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Hennig, Joshua, Klier, Jens, Duran, Stefan, Hsu, Kuei-Shen, Beyer, Jan, Roeder, Christian, Beyer, Franziska C., Schueler, Nadine, Vieweg, Nico, Dutzi, Katja, von Freymann, Georg, Molter, Daniel
Format:	Preprint
Published:	2025
Subjects:	Optics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2506.14945