Dynamic buckling of Si tetramers on the Si(111)-7x7

Documenti analoghi

• First-principles studies of Schottky barriers and tunneling properties at Al(111)/Si(111) and CoSi$_2$(111)/Si(111) interfaces
  di: Nangoi, J. K., et al.
  Pubblicazione: (2024)
• Effect of UHV annealing on morphology and roughness of sputtered $Si(111)-(7\times7)$ surfaces
  di: Mahato, Jagadish Chandra, et al.
  Pubblicazione: (2024)
• First-principles predictions of the diversity in atomic structures and electronic properties of the reconstructed Si(111)-7x7 surface
  di: Song, Yuke, et al.
  Pubblicazione: (2025)
• Atomistic modeling of diffusion processes at Al(Si)/Si(111) interphase boundaries obtained by vapor deposition
  di: Li, Yang, et al.
  Pubblicazione: (2024)
• $P$-type Ru$_2$Ti$_{1-x}$Hf$_x$Si full-Heusler bulk thermoelectrics with $zT = 0.7$
  di: Garmroudi, Fabian, et al.
  Pubblicazione: (2025)