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Main Authors: Lee, Juhyeok, Yang, Yongsoo
Format: Preprint
Published: 2025
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Online Access:https://arxiv.org/abs/2506.16104
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author Lee, Juhyeok
Yang, Yongsoo
author_facet Lee, Juhyeok
Yang, Yongsoo
contents Accurate determination of three-dimensional (3D) atomic structures is crucial for understanding and controlling the properties of nanomaterials. Atomic electron tomography (AET) offers non-destructive atomic imaging with picometer-level precision, enabling the resolution of defects, interfaces, and strain fields in 3D, as well as the observation of dynamic structural evolution. However, reconstruction artifacts arising from geometric limitations and electron dose constraints can hinder reliable atomic structure determination. Recent progress has integrated deep learning, especially convolutional neural networks, into AET workflows to improve reconstruction fidelity. This review highlights recent advances in neural network-assisted AET, emphasizing its role in overcoming persistent challenges in 3D atomic imaging. By significantly enhancing the accuracy of both surface and bulk structural characterization, these methods are advancing the frontiers of nanoscience and enabling new opportunities in materials research and technology.
format Preprint
id arxiv_https___arxiv_org_abs_2506_16104
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Advancing atomic electron tomography with neural networks
Lee, Juhyeok
Yang, Yongsoo
Materials Science
Machine Learning
Accurate determination of three-dimensional (3D) atomic structures is crucial for understanding and controlling the properties of nanomaterials. Atomic electron tomography (AET) offers non-destructive atomic imaging with picometer-level precision, enabling the resolution of defects, interfaces, and strain fields in 3D, as well as the observation of dynamic structural evolution. However, reconstruction artifacts arising from geometric limitations and electron dose constraints can hinder reliable atomic structure determination. Recent progress has integrated deep learning, especially convolutional neural networks, into AET workflows to improve reconstruction fidelity. This review highlights recent advances in neural network-assisted AET, emphasizing its role in overcoming persistent challenges in 3D atomic imaging. By significantly enhancing the accuracy of both surface and bulk structural characterization, these methods are advancing the frontiers of nanoscience and enabling new opportunities in materials research and technology.
title Advancing atomic electron tomography with neural networks
topic Materials Science
Machine Learning
url https://arxiv.org/abs/2506.16104