Shi, H., He, Y., Song, S., Zhuge, J., & Mao, J. (2025). Physical-Layer Signal Injection Attacks on EV Charging Ports: Bypassing Authentication via Electrical-Level Exploits.
Chicago Style (17th ed.) CitationShi, Hetian, Yi He, Shangru Song, Jianwei Zhuge, and Jian Mao. Physical-Layer Signal Injection Attacks on EV Charging Ports: Bypassing Authentication via Electrical-Level Exploits. 2025.
MLA (9th ed.) CitationShi, Hetian, et al. Physical-Layer Signal Injection Attacks on EV Charging Ports: Bypassing Authentication via Electrical-Level Exploits. 2025.
Warning: These citations may not always be 100% accurate.