Physical-Layer Signal Injection Attacks on EV Charging Ports: Bypassing Authentication via Electrical-Level Exploits

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Shi, Hetian, He, Yi, Song, Shangru, Zhuge, Jianwei, Mao, Jian
Format: Preprint
Published: 2025
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!