Directional Dark Field for Nanoscale Full-Field Transmission X-Ray Microscopy
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arXiv
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| Format: | Preprint |
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2025
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| author | Wirtensohn, Sami Flenner, Silja John, Dominik Qi, Peng David, Christian May, Manfred Huber, Patrick Herzog, Dirk Tangl, Stefan Kampleitner, Carina Singh, Kritika Kelbassa, Ingomar Bekes, Katrin Herzen, Julia Greving, Imke |
| author_facet | Wirtensohn, Sami Flenner, Silja John, Dominik Qi, Peng David, Christian May, Manfred Huber, Patrick Herzog, Dirk Tangl, Stefan Kampleitner, Carina Singh, Kritika Kelbassa, Ingomar Bekes, Katrin Herzen, Julia Greving, Imke |
| contents | Dark-field X-ray imaging visualizes structural inhomogeneities through small-angle scattering, but existing directional methods are confined to the micrometer scale. While recent advances have extended dark-field capabilities to nanoscale transmission X-ray microscopy, directional scattering retrieval - critical for characterizing anisotropic nanostructures - has remained inaccessible for imaging resolutions in the sub-micrometer scale. Here, we demonstrate the first directional dark-field setup for nanoimaging, achieving orientation mapping of scattering features below the spatial resolution limit. Our method is experimentally simple to implement with existing transmission X-ray microscopy setups. We validate its performance by successfully resolving sub-resolution test structure orientations, cross-correlating orientational changes within hierarchical nanoporous materials, and mapping the directional arrangement of hydroxyapatite nanocrystals 30 - 70 nm within human tooth enamel. By utilizing shadow regions in the optical configuration, we further extend the detectable scattering vector range, demonstrating a pathway toward size-selective dark-field imaging. This advancement enables the quantitative structural characterization of anisotropic nanomaterials, which are critical to biomineralization, advanced materials, and nanotechnology applications. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2506_16998 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Directional Dark Field for Nanoscale Full-Field Transmission X-Ray Microscopy Wirtensohn, Sami Flenner, Silja John, Dominik Qi, Peng David, Christian May, Manfred Huber, Patrick Herzog, Dirk Tangl, Stefan Kampleitner, Carina Singh, Kritika Kelbassa, Ingomar Bekes, Katrin Herzen, Julia Greving, Imke Optics Instrumentation and Detectors Dark-field X-ray imaging visualizes structural inhomogeneities through small-angle scattering, but existing directional methods are confined to the micrometer scale. While recent advances have extended dark-field capabilities to nanoscale transmission X-ray microscopy, directional scattering retrieval - critical for characterizing anisotropic nanostructures - has remained inaccessible for imaging resolutions in the sub-micrometer scale. Here, we demonstrate the first directional dark-field setup for nanoimaging, achieving orientation mapping of scattering features below the spatial resolution limit. Our method is experimentally simple to implement with existing transmission X-ray microscopy setups. We validate its performance by successfully resolving sub-resolution test structure orientations, cross-correlating orientational changes within hierarchical nanoporous materials, and mapping the directional arrangement of hydroxyapatite nanocrystals 30 - 70 nm within human tooth enamel. By utilizing shadow regions in the optical configuration, we further extend the detectable scattering vector range, demonstrating a pathway toward size-selective dark-field imaging. This advancement enables the quantitative structural characterization of anisotropic nanomaterials, which are critical to biomineralization, advanced materials, and nanotechnology applications. |
| title | Directional Dark Field for Nanoscale Full-Field Transmission X-Ray Microscopy |
| topic | Optics Instrumentation and Detectors |
| url | https://arxiv.org/abs/2506.16998 |