Bayesian Joint Model of Multi-Sensor and Failure Event Data for Multi-Mode Failure Prediction

Fuente: arXiv

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Bibliographic Details
Main Authors:	Fard, Sina Aghaee Dabaghan, Kim, Minhee, Deep, Akash, Lee, Jaesung
Format:	Preprint
Published:	2025
Subjects:	Methodology Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2506.17036