A Morphologically Self-Consistent Phase Field Model for the Computational Study of Memristive Thin Film Current-Voltage Hysteresis

Fuente: arXiv

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Bibliographic Details
Main Authors:	Sevic, John F., Juston, Ambroise, Kobayashi, Nobuhiko P.
Format:	Preprint
Published:	2025
Subjects:	Materials Science Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2506.17421