Cover Image

Large volume 'chunk' lift out for 3D tomographic analysis using analytical plasma focussed ion beam -- scanning electron microscopy

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Birch, Ruth, Li, Shuheng, Sharang, Sharang, Poole, Warren J., Britton, Ben
Format:	Preprint
Published:	2025
Subjects:	Materials Science Instrumentation and Detectors
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Similar Items

Rubidium and cesium ion-induced electron and ion signals for scanning ion microscopy applications
by: Li, Y., et al.
Published: (2024)

Compressive multi-beam scanning transmission electron microscopy
by: Yasuhara, Akira, et al.
Published: (2025)

Semicircular-aperture illumination scanning transmission electron microscopy
by: Yasuhara, Akira, et al.
Published: (2024)

Ultrafast 4D scanning transmission electron microscopy for imaging of localized optical fields
by: Koutenský, Petr, et al.
Published: (2025)

Hydrogen plasma inhibits ion beam restructuring of materials
by: Scott, John A., et al.
Published: (2024)

The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy
by: Ercius, Peter, et al.
Published: (2023)

Quantitative structure determination from experimental four-dimensional scanning transmission electron microscopy via the scattering matrix
by: Terzoudis-Lumsden, Emmanuel W. C., et al.
Published: (2025)

Angular Resolution Enhancement of Electron Backscatter Diffraction Patterns
by: Britton, Ben, et al.
Published: (2025)

Time-correlated electron and photon counting microscopy
by: Yanagimoto, Sotatsu, et al.
Published: (2023)

Scanning through space and time: past, present, and future of time-resolved scanning transmission soft X-ray microscopy
by: Finizio, Simone, et al.
Published: (2026)

Increasing the resolution of transmission electron microscopy by computational ghost imaging
by: Rosi, P., et al.
Published: (2023)

Development of precession Lorentz transmission electron microscopy
by: Hayashi, Shunsuke, et al.
Published: (2025)

Characterization of ion-beam-sputtered AlF$_3$ thin films for gravitational-wave interferometers
by: Bischi, M., et al.
Published: (2022)

Imaging nanomechanical vibrations and manipulating parametric mode coupling via scanning microwave microscopy
by: Xu, Hao, et al.
Published: (2024)

The development of IBIC microscopy at the 100 kV ion implanter of the University of Torino (LIUTo) and the application for the assessment of the radiation hardness of a silicon photodiode
by: Corte, Emilio, et al.
Published: (2025)

Performance of the Endcap Time-of-Flight detector in the STAR beam-energy scan
by: Labonté, Mathias C., et al.
Published: (2026)

Development of ion-beam sputtered silicon nitride thin films for low-noise mirror coatings of gravitational-wave detectors
by: Amato, A., et al.
Published: (2024)

Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope
by: Zhang, Tianbi, et al.
Published: (2024)

Performance evaluation of electron multiplier tubes as a high-intensity muon beam monitor of accelerator neutrino experiments
by: Honjo, Takashi, et al.
Published: (2024)

Crossed laser phase plates for transmission electron microscopy
by: Petrov, Petar N., et al.
Published: (2024)

Performance assessment of the HERD calorimeter with a photo-diode read-out system for high-energy electron beams
by: Adriani, O., et al.
Published: (2024)

Separate-scan atomic force microscope for fast infrared scattering-type scanning near-field optical microscope
by: Sakiyama, Yusuke, et al.
Published: (2025)

Background Remover -- an effective tool for processing noisy microscopy images
by: Kilian, Anna, et al.
Published: (2026)

HIBISCUS: a new ion beam radio-frequency quadrupole cooler-buncher for high-precision experiments with exotic radioactive ions
by: Jaries, A., et al.
Published: (2025)

Large-area photonic circuits for terahertz detection and beam profiling
by: Tomasino, A., et al.
Published: (2024)

Laser-driven cold-field emission source for ultrafast transmission electron microscopy
by: Schröder, Alexander, et al.
Published: (2024)

Dielectric nanotomography based on electrostatic force microscopy: A numerical analysis
by: Fabregas, Rene, et al.
Published: (2025)

Improving the temporal resolution of event-based electron detectors using neural network cluster analysis
by: Schröder, Alexander, et al.
Published: (2023)

HitPix3 -- a new HV-CMOS active pixel sensor for ion beam therapy
by: Zhang, Hui, et al.
Published: (2025)

Performance of the prototype Silicon Tracking System of the CBM experiment tested with heavy-ion beams at SIS18
by: The CBM Collaboration
Published: (2025)

Characterization of resonator using confocal laser scanning microscopy and its application in air density sensing
by: Hazrathosseini, Ayla, et al.
Published: (2024)

A thermionic electron gun to characterize silicon drift detectors with electrons
by: Urban, Korbinian, et al.
Published: (2024)

Shot noise-mitigated secondary electron imaging with ion count-aided microscopy
by: Agarwal, Akshay, et al.
Published: (2023)

Compton imaging of undepleted volumes of germanium detectors
by: Abt, Iris, et al.
Published: (2026)

Controlled beams of cryo-cooled protein-like nanoparticles
by: He, Jingxuan, et al.
Published: (2026)

Precision determination of the track-position resolution of beam telescopes
by: Antonello, M., et al.
Published: (2024)

Simulation of radiation environment for the beam monitor of CEE experiment
by: Wang, Qian, et al.
Published: (2025)

Uncertainty analysis of the plasma impedance probe
by: Brooks, John W., et al.
Published: (2024)

A high-temperature furnace for multi-modal synchrotron-based X-ray microscopy and diffraction imaging
by: Lesage, Louis, et al.
Published: (2025)

Optimization of qPlus sensor geometry and circuit for high-speed atomic force microscopy in liquid environments
by: Ichii, Takashi, et al.
Published: (2026)