Nanoscale imaging of reduced forward bias at V-defects in green-emitting nitride LEDs

Fuente: arXiv

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Bibliographic Details
Main Authors:	Fornos, C., Alyabyeva, N., Ho, W. Y., Roubert, C., Tak, T., Speck, J. S., Weisbuch, C., Peretti, J., Rowe, A. C. H.
Format:	Preprint
Published:	2025
Subjects:	Applied Physics Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2506.18025