Wide-field Hyperspectral Optical Microscopy for Rapid Characterization of Two-Dimensional Semiconductors and Heterostructures

Fuente: arXiv

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Bibliographic Details
Main Authors:	Peng, Zhenghan, Uthman, Adeyemi, Zhang, Zhepeng, Hoang, Anh Tuan, Zhu, Xiang, Pop, Eric, Mannix, Andrew J.
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2506.18342